High Thermal Conductivity Non-Pressure Sintering Type
Die Bonding Material for SiC Power Semiconductor Packages
High Performance/Low Cost Manufacturing Competitiveness
Compared to Global Competitors
Die attach paste based on Teraon’s proprietary composite material
formulation design technology and production system
• Void within 5%(Based on evaluation of
global power module)
• No cracks or delamination observed during thermal cycle testing
• Low modulus(<15GPa)
• Low resistance at the level of 4x10-6 Ωcm
• High thermal conductivity of 150W/mK or higher
• Excellent sintering density, electrical conductivity, and adhesive strength
• Reduced Rds(on) by approximately 5% compared to pressured film-type die bonding material
(Based on test results using the same package)
Dispensing and Screen Printing Possible
Viscosity and Thixotropic Index Adjustable
Workable for 24+ Hours
Storage Stability of 6+ Months
Applicable to Various Chip Sizes:
From 1x1mm2 to 8x8mm2
Open Time | 0hr | 1hr | 2hr |
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Printing |
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Die Attach |
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Open Time | 0hr | 1hr | 2hr |
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Dispensing |
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Die Attach |
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Die Shear Strength Test
C-Scan
Die Shear Tester |
Adhesion strength between the Die and the junction area of semiconductor components (such as DBC interface) plays a crucial role. Teraon quantitatively measures the adhesion strength using Die Shear Tester to enhance reliability and stability in the manufacturing process. |
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C-Scan |
We analyze voids, cracks, and other properties at the interface of semiconductor packages using non-destructive evaluation. This helps us analyze die attach behavior after thermal treatment and performance after environmental testing. |
LFA (Laser Flash Analysis) |
Analysis of thermal conductivity characteristics, a key property of Die Attach Paste’s heat dissipation performance, to optimize the heat transfer capability of various Die Attach Paste products and prevent heat generation issues in the product. |
DSC (Differential Scanning Calorimetry) |
Understanding the thermal behavior of Die Attach Paste composition and setting the optimal material properties design and heat treatment process for different compositions through DSC analysis. |
DMA (Dynamic mechanical Analysis) |
Analysis of modulus, a key property of durability against thermal and mechanical stress between chips and substrates, to ensure high reliability of the product. |
The use of non-pressurized, low modulus silver low-temperature sintering technology ensures minimal
chip damage, enables the application of large-sized chips and achieves other excellent properties.
Excellent thermal
conductivity
Superior bonding
strength
High energy
efficiency
Low modulus
Excellent thermal conductivity(>150W/mK), superior bonding strength
(>4kgf/1x1mm2), low modulus(<15GPa)
The non-pressurized sintering method reduces RDS(ON) values for
improved energy efficiency
5% reduction in RDS(ON) compared to film-type chip bonding materials
from competitive companies that use pressurized methods
Short process time: 90 minutes(170°C/15min -> 250°C/60min)
TERABOND®-2020H TDS | TERABOND®-1020H TDS | |
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Thermal Conductivity(W/mk) | > 150 | < 150 |
Electrical Resistivity ( X 10-6 Ωcm) | < 5.0 | < 6.0 |
Die Shear Strength (Kgf/1*1mm2) | > 4.0 | > 2.0 |
Modulus(Gpa, 25℃) | < 15 | < 10 |
Process Temperature(℃) | 170 ~ 250 | 170 ~ 250 |
Die Cover Size | 1x1 ~ 8x8mm2 | 1x1 ~ 8x8mm2 |
Workable Surface | Ag, Au, Cu, etc. | Ag, Au, Cu, etc. |
Application Process | Screen Printing/Dispensing | Screen Printing/Dispensing |
Applications |
Die Attach Die Top Attach Spacer Attach |
Die Attach Die Top Attach Spacer Attach |